Description
42N/m, 320kHz, 10nm Tip Radius, 600nm-Wide-Spike @ 8µm, Al reflective coating DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS 42N/m, 320kHz, 10nm Tip Radius, 600nm-Wide-Spike @ 8µm, Al reflective coating
High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 12:1 at 8um from tip apex. Tip Geometry:
High Aspect Ratio Tip Height:
10 – 15 Front Angle:
2 ± 0.5 Back Angle:
2 ± 0.5 Side Angle:
2 ± 0.5 Tip Radius (Nom):
10 Tip Radius (Max):
15 Tip Set Back (Nom):
15 Tip Set Back( RNG):
5 – 25 Tilt Compensation:
12 Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications. Cantilever Material:
0.01 – 0.025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom):
4 Cantilever Thickness (RNG):
3.25 – 4.75 Cantilever Geometry:
Rectangular Cantilevers Number:
1 Back Side Coating:
Reflective Aluminum
