Description
DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS High wear resistant diamond cone probe with high probe-to-probe consistency in tip shape and a tip-radius of 20nm. Ideally suited to long lifetime imaging on low relief samples at moderately high resolution. Conductive with a contact resistance in the 100kOhm range. Intermediate spring constant of 8N/m. For even higher resolution consider the AD series of diamond probes. Applications include Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.
Electrical characterization with PeakForce TUNA, TUNA, CAFM.
Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation. Highly wear resistant, single crystal boron-doped diamond probes. Conductive with a contact resistance in the 100kOhm range. 20nm end radius. Tip Geometry:
Standard Tip Height:
12.5 +/- 2.5 Front Angle:
25+/-5 Back Angle:
15+/-5 Side Angle:
22.5+/-5 Tip Radius (Nom):
20 Tip Coating:
Highly conductive single cystal diamond Tip Set Back (Nom):
15-25 Tilt Compensation:
1 +/- 1 Cantilever Material:
Diamond cone probe, 100N/m Cantilever Thickness (Nom):
4 Cantilever Thickness (RNG):
3.5-4.5 Cantilever Geometry:
Rectangular Cantilevers Number:
1 Back Side Coating:
Reflective Au
