Description
Conductive Probes, 3N/m, 75kHz, 10-Pack DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS Bruker’s new SCM-PIT-V2 probe replaces the legacy SCM-PIT probe. Built on the high-performance RFESP-75 AFM probe, Bruker’s SCM-PIT-V2 probe has a Platinum-Iridium coated,electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM), Kelvin Probe Force Microscopy (KPFM), ScanningCapacitance Microscopy (SCM), and other electrical characterizationapplications. The Pt-Ir coating on the front side of the cantileverprovides a metallic electrical path from the cantilever die to the apexof the tip. The coating on the back side of the cantilever compensatesfor the stress created by the front side coating and also enhances laserreflectivity by a factor of up to 2.5 times. AFM users with Bruker’s latest electrical characterization techniquesbased upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes. The new design provides: Tighter dimensional specifications for improved probe to probe consistency
Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
Improved probe quality and aesthetics This probe uses a rotated tip to provide a more symmetric representation of features over 200nm. Tip Geometry:
Rotated Tip Height:
10 – 15 Front Angle:
17.5 ± 2.5 Back Angle:
25 ± 2.5 Side Angle:
20 ± 2.5 Tip Radius (Nom):
25 Tip Coating:
PtIr Tip Set Back (Nom):
9.5 Tip Set Back( RNG):
7 – 12 The Platinum-Iridium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications. Cantilever Material:
0.01 – 0.025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom):
2.8 Cantilever Thickness (RNG):
2.05 – 3.55 Cantilever Geometry:
Rectangular Cantilevers Number:
1 Front Side Coating:
Conductive PtIr Back Side Coating:
Reflective PtIr
